• DocumentCode
    1479764
  • Title

    The Semi-Superjunction IGBT

  • Author

    Antoniou, Marina ; Udrea, Florin ; Bauer, Friedhelm ; Nistor, Iulian

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Cambridge, Cambridge, UK
  • Volume
    31
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    591
  • Lastpage
    593
  • Abstract
    In this letter, we propose a new device, the Semi-Superjunction (SJ) (Semi-SJ) insulated-gate bipolar transistor (IGBT) (Semi-SJ IGBT). The device offers significant improvement in the on state and switching tradeoff compared with the state-of-the-art FieldStop Trench IGBT (FS IGBT). Furthermore, when compared with a full SJ IGBT, the device has a considerably simpler process of manufacturing as the existing fabrication process for the “CoolMOS” could be used. The Semi-SJ IGBT offers better robustness against cosmic rays compared with an FS IGBT; the failure-in-time per surface area (FIT/A) of the device levels are up to two orders of magnitude lower. Alternatively, by changing the structure parameters, one can improve dramatically the on state versus switching tradeoff while maintaining the same FIT/A levels.
  • Keywords
    insulated gate bipolar transistors; semiconductor device manufacture; fabrication process; failure-in-time per surface area; insulated gate bipolar transistor; semi-superjunction IGBT; Cosmic rays; insulated gate bipolar transistor (IGBT); superjunction (SJ);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2010.2046132
  • Filename
    5454412