DocumentCode
1479764
Title
The Semi-Superjunction IGBT
Author
Antoniou, Marina ; Udrea, Florin ; Bauer, Friedhelm ; Nistor, Iulian
Author_Institution
Dept. of Electr. Eng., Univ. of Cambridge, Cambridge, UK
Volume
31
Issue
6
fYear
2010
fDate
6/1/2010 12:00:00 AM
Firstpage
591
Lastpage
593
Abstract
In this letter, we propose a new device, the Semi-Superjunction (SJ) (Semi-SJ) insulated-gate bipolar transistor (IGBT) (Semi-SJ IGBT). The device offers significant improvement in the on state and switching tradeoff compared with the state-of-the-art FieldStop Trench IGBT (FS IGBT). Furthermore, when compared with a full SJ IGBT, the device has a considerably simpler process of manufacturing as the existing fabrication process for the “CoolMOS” could be used. The Semi-SJ IGBT offers better robustness against cosmic rays compared with an FS IGBT; the failure-in-time per surface area (FIT/A) of the device levels are up to two orders of magnitude lower. Alternatively, by changing the structure parameters, one can improve dramatically the on state versus switching tradeoff while maintaining the same FIT/A levels.
Keywords
insulated gate bipolar transistors; semiconductor device manufacture; fabrication process; failure-in-time per surface area; insulated gate bipolar transistor; semi-superjunction IGBT; Cosmic rays; insulated gate bipolar transistor (IGBT); superjunction (SJ);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2010.2046132
Filename
5454412
Link To Document