Title : 
ArbitCheck: A Highly Automated Property-Based Testing Tool for Java
         
        
            Author : 
Yatoh, Kohsuke ; Sakamoto, Kazumitsu ; Ishikawa, Fuyuki ; Honiden, Shinichi
         
        
            Author_Institution : 
Univ. of Tokyo, Tokyo, Japan
         
        
        
            fDate : 
March 31 2014-April 4 2014
         
        
        
        
            Abstract : 
Lightweight property-based testing tools are becoming popular these days. With property-based testing, developers can test properties of the system under test against large varieties of randomly generated inputs without writing test cases. Despite the advantages of property-based testing, current property-based testing tools have a major drawback: they require developers to write generator functions for user-defined types. This is because it is difficult for a tool to infer the possible values for the type. However, user-defined generators sometimes fail to find faults by only producing overly limited varieties of values. In this paper, we present a new property-based testing tool, called ArbitCheck, which automates object generation by adapting the feedback-directed random test generation technique. With the help of feedback-directed random test generation, ArbitCheck exhaustively generates possible values of user-defined types and tests properties with them, so that it can reveal faults that are hard to find with either manually written tests or existing property-based testing tools.
         
        
            Keywords : 
Java; program testing; ArbitCheck; Java testing tool; generator functions; highly automated property; object generation; property based testing; Computer bugs; Generators; Java; Monitoring; Software; Testing; Writing; Feedback-directed random test generation; Java; Object-oriented; Property-based testing; QuickCheck; Random testing; Randoop; Unit testing;
         
        
        
        
            Conference_Titel : 
Software Testing, Verification and Validation Workshops (ICSTW), 2014 IEEE Seventh International Conference on
         
        
            Conference_Location : 
Cleveland, OH
         
        
        
            DOI : 
10.1109/ICSTW.2014.68