BER analysis of direct conversion OFDM systems with MRC under channel estimation errors

Author

López-Martínez, F. Javier ; Martos-Naya, Eduardo ; Paris, José F. ; Entrambasaguas, J. Tomá

Author_Institution

Dipt. Ing. de Comun., Univ. de Malaga, Malaga, Spain

Volume

14

Issue

5

fYear

2010

fDate

5/1/2010 12:00:00 AM

Firstpage

423

Lastpage

425

Abstract

In this letter, we calculate an exact closed-form expression for the bit error rate (BER) of orthogonal frequency division multiplexing (OFDM) systems with direct conversion that employ maximal ratio combining (MRC) reception in multipath Rayleigh fading channels, using binary phase-shitf keying (BPSK) modulation. We assume a realistic system model where direct current (DC) offset, carrier frequency offset (CFO) and imperfect channel state information (ICSI) are simultaneously considered. Results show the appearance of an irreducible BER floor due to DC offset and ICSI. As a rule of thumb, we provide a simple expression for the maximum DC offset allowable in a direct conversion receiver.

Keywords

OFDM modulation; Rayleigh channels; channel estimation; diversity reception; multipath channels; phase shift keying; radio receivers; BER analysis; BPSK modulation; CFO; DC offset; ICSI; MRC reception; binary phase-shitf keying modulation; bit error rate; carrier frequency offset; channel estimation errors; closed-form expression; direct conversion OFDM systems; direct conversion receiver; direct current offset; imperfect channel state information; irreducible BER floor; maximal ratio combining reception; multipath Rayleigh fading channels; orthogonal frequency division multiplexing systems; realistic system model; Binary phase shift keying; Bit error rate; Channel estimation; Channel state information; Closed-form solution; Diversity reception; Fading; OFDM modulation; Phase modulation; Thumb; Orthogonal frequency division multiplexing, DC offset, carrier frequency offset, channel estimation error, bit error rate;

fLanguage

English

Journal_Title

Communications Letters, IEEE

Publisher

ieee

ISSN

1089-7798

Type

jour

DOI

10.1109/LCOMM.2010.05.092257

Filename

5456053