• DocumentCode
    1480499
  • Title

    Incremental Test Generation for Software Product Lines

  • Author

    Uzuncaova, Engin ; Khurshid, Sarfraz ; Batory, Don

  • Author_Institution
    Microsoft, Redmond, WA, USA
  • Volume
    36
  • Issue
    3
  • fYear
    2010
  • Firstpage
    309
  • Lastpage
    322
  • Abstract
    Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence, to deploy more dependable software. This paper builds on one such systematic technique, scope-bounded testing, to develop a novel specification-based approach for efficiently generating tests for products in a software product line. Given properties of features as first-order logic formulas in Alloy, our approach uses SAT-based analysis to automatically generate test inputs for each product in a product line. To ensure soundness of generation, we introduce an automatic technique for mapping a formula that specifies a feature into a transformation that defines incremental refinement of test suites. Our experimental results using different data structure product lines show that an incremental approach can provide an order of magnitude speedup over conventional techniques. We also present a further optimization using dedicated integer constraint solvers for feature properties that introduce integer constraints, and show how to use a combination of solvers in tandem for solving Alloy formulas.
  • Keywords
    computability; data structures; program testing; program verification; Alloy formulas; SAT-based analysis; data structure product lines; dedicated integer constraint solvers; first-order logic formulas; incremental test generation; mechanical techniques; program verification; scope-bounded testing; software product lines; specification-based approach; systematic testing; Software/program verification; software engineering.; testing and debugging;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/TSE.2010.30
  • Filename
    5456077