DocumentCode :
1480508
Title :
Wafer-level in-registry microstamping
Author :
Folch, Albert ; Schmidt, Martin A.
Author_Institution :
Microsyst. Technol. Lab., MIT, Cambridge, MA, USA
Volume :
8
Issue :
1
fYear :
1999
fDate :
3/1/1999 12:00:00 AM
Firstpage :
85
Lastpage :
89
Abstract :
Microstamping is an inexpensive technique that allows for micrometer-scale patterning of a rich variety of materials by a replication procedure based on an elastomeric stamp. We have investigated the scalability of microstamping for its use in the fabrication of microelectromechanical systems. Until now, the application of microstamping to multilayer processing at a wafer level has been impaired by the flexibility of the stamp. By mounting the stamp onto a rigid glass surface, we demonstrate the feasibility of in-registry multilayer microstamping at a 4-in wafer level
Keywords :
micromechanical devices; replica techniques; 4 in; elastomeric stamp; fabrication; microelectromechanical system; multilayer patterning; replication; rigidity; wafer-level in-registry microstamping; Biological materials; Biomedical materials; Fabrication; Glass; Helium; Microelectromechanical systems; Microelectronics; Micromechanical devices; Nonhomogeneous media; Scalability;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.749407
Filename :
749407
Link To Document :
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