DocumentCode :
1480693
Title :
Effect of Surface Texture and Backside Patterned Reflector on the AlGaInP Light-Emitting Diode: High Extraction of Waveguided Light
Author :
Lee, Ya-Ju ; Lee, Chia-Jung ; Chen, Chih-Hao
Author_Institution :
Inst. of Electro-Opt. Sci. & Technol., Nat. Taiwan Normal Univ., Taipei, Taiwan
Volume :
47
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
636
Lastpage :
641
Abstract :
This paper describes a novel structure of an AlGaInP light-emitting diode (LED) to extract the waveguided light for high-brightness applications. Four devices are considered and compared. They are AlGaInP-sapphire LEDs with: 1) a planar Ag reflector (LED-A); 2) a patterned Ag reflector (LED-B); 3) a planar Ag reflector and surface-roughened features (LED-C); and 4) a patterned Ag reflector and surface-roughened features (LED-D). The patterned Ag reflector can be used to direct some of the waveguided light that bounces within the AlGaInP LED and sapphire substrate to the top escape cone of the LED surface. Additionally, the roughened features, which are randomly distributed on the LED surface, enable the waveguided light that is trapped inside the LED chip to be coupled efficiently into the air. As a result, the external quantum efficiencies of LED-A, LED-B, LED-C, and LED-D measured at I = 350 mA are η = 9.20%, 10.46%, 15.22%, and 16.75%, respectively.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; light emitting diodes; optical waveguides; silver; surface texture; Al2O3; AlGaInP-Ag; backside patterned reflector; external quantum efficiencies; high-brightness applications; light-emitting diode; planar reflector; sapphire substrate; surface texture; surface-roughness; waveguided light extraction; Feature extraction; Light emitting diodes; Optical surface waves; Rough surfaces; Substrates; Surface roughness; Surface waves; AlGaInP; light emitting diode; waveguided light;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2011.2107891
Filename :
5738955
Link To Document :
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