• DocumentCode
    1480736
  • Title

    Characterization of Via Structures in Multilayer Printed Circuit Boards With an Equivalent Transmission-Line Model

  • Author

    Pan, Siming ; Fan, Jun

  • Author_Institution
    Cisco Syst., Inc., San Jose, CA, USA
  • Volume
    54
  • Issue
    5
  • fYear
    2012
  • Firstpage
    1077
  • Lastpage
    1086
  • Abstract
    Vias are typical discontinuities for high-speed signal transmission in printed circuit boards (PCBs). This paper proposes an equivalent multiconductor transmission-line model for via structures in multilayer PCBs. The proposed model is based on the physic-based circuit model, taking into account distributed effects. Various via structures with arbitrary via number, trace connections, and via stubs can be effectively handled in the equivalent transmission-line model, which is sufficiently accurate and fast to be integrated into circuit simulators for via and link-path analysis. With the proposed model, well-known transmission-line theories can be borrowed for via modeling and characterization for signal integrity in high-speed digital circuits. The proposed model is validated with both full-wave simulations and measurements for multilayer PCBs with different via structures.
  • Keywords
    digital circuits; multiconductor transmission lines; printed circuit interconnections; vias; PCB; arbitrary via number; circuit simulators; distributed effects; equivalent transmission-line model; full-wave simulations; high-speed digital circuits; high-speed signal transmission; link-path analysis; multiconductor transmission-line model; multilayer printed circuit boards; physic-based circuit model; trace connections; via structures; via stubs; vias; Capacitance; Impedance; Integrated circuit modeling; Nonhomogeneous media; Stripline; Transmission line matrix methods; Equivalent multiconductor transmission-line model for vias; multilayer PCBs; signal integrity; via modeling and characterization;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2012.2187664
  • Filename
    6176213