DocumentCode :
1480736
Title :
Characterization of Via Structures in Multilayer Printed Circuit Boards With an Equivalent Transmission-Line Model
Author :
Pan, Siming ; Fan, Jun
Author_Institution :
Cisco Syst., Inc., San Jose, CA, USA
Volume :
54
Issue :
5
fYear :
2012
Firstpage :
1077
Lastpage :
1086
Abstract :
Vias are typical discontinuities for high-speed signal transmission in printed circuit boards (PCBs). This paper proposes an equivalent multiconductor transmission-line model for via structures in multilayer PCBs. The proposed model is based on the physic-based circuit model, taking into account distributed effects. Various via structures with arbitrary via number, trace connections, and via stubs can be effectively handled in the equivalent transmission-line model, which is sufficiently accurate and fast to be integrated into circuit simulators for via and link-path analysis. With the proposed model, well-known transmission-line theories can be borrowed for via modeling and characterization for signal integrity in high-speed digital circuits. The proposed model is validated with both full-wave simulations and measurements for multilayer PCBs with different via structures.
Keywords :
digital circuits; multiconductor transmission lines; printed circuit interconnections; vias; PCB; arbitrary via number; circuit simulators; distributed effects; equivalent transmission-line model; full-wave simulations; high-speed digital circuits; high-speed signal transmission; link-path analysis; multiconductor transmission-line model; multilayer printed circuit boards; physic-based circuit model; trace connections; via structures; via stubs; vias; Capacitance; Impedance; Integrated circuit modeling; Nonhomogeneous media; Stripline; Transmission line matrix methods; Equivalent multiconductor transmission-line model for vias; multilayer PCBs; signal integrity; via modeling and characterization;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2012.2187664
Filename :
6176213
Link To Document :
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