DocumentCode :
1480980
Title :
Switched-current circuit design issues
Author :
Fiez, Terri S. ; Liang, Guojin ; Allstot, David J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
Volume :
26
Issue :
3
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
192
Lastpage :
202
Abstract :
Switched-current (SI) circuits represent a current-mode analog sampled-data signal processing technique realizable in standard digital CMOS technologies. Unlike switched-capacitor (SC) circuits, SI circuits require only a standard digital CMOS process. SI circuits use MOS transistors as the storage elements to provide analog memory capability. Similar to the operation of dynamic logic circuits, a voltage is sampled onto the gate of a MOSFET and held on its noncritical gate capacitance. The held voltage signal on the gate causes a corresponding held current signal in the drain, usually proportional to the square of the gate-to-source voltage. Design issues related to the implementation and performance of SI circuits are presented. SI filters show comparable performance to SC filters except in terms of passband accuracy. The major source of error is nonunity current gain in the SI integrator due to device mismatch and clock-feedthrough effects. For the initial CMOS prototypes, the current track and hold (T/H) gain error was about 2.5%
Keywords :
CMOS integrated circuits; analogue storage; insulated gate field effect transistors; integrating circuits; MOS transistors; MOSFET; analog memory capability; clock-feedthrough effects; current-mode analog sampled-data signal processing technique; device mismatch; digital CMOS process; held current signal; held voltage signal; noncritical gate capacitance; nonunity current gain; passband accuracy; standard digital CMOS technologies; storage elements; track-and-hold gain error; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS memory circuits; CMOS process; CMOS technology; Circuit synthesis; Digital signal processing; Filters; Switching circuits; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.74996
Filename :
74996
Link To Document :
بازگشت