DocumentCode :
1481183
Title :
On the Extension of the Continuous Class-F Mode Power Amplifier
Author :
Carrubba, Vincenzo ; Clarke, Alan L. ; Akmal, Muhammad ; Lees, Jonathan ; Benedikt, Johannes ; Tasker, Paul J. ; Cripps, Steve C.
Author_Institution :
Centre for High Freq. Eng., Cardiff Univ., Cardiff, UK
Volume :
59
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1294
Lastpage :
1303
Abstract :
The extended continuous class-F mode RF power amplifier (PA) is presented for the first time. The introduction and experimental validation of this novel PA mode demonstrates a new design space over a wide band of frequencies. This paper will show that high output power and drain efficiency, equivalent to the class-F mode, can be maintained by varying the reactive components of fundamental and second harmonic impedances in accordance with the new formulation of the voltage waveform. Additionally it will be shown that, by varying both phase and magnitude of the fundamental and second harmonic impedances, a yet wider design space can be achieved, where the efficiency is maintained at a level greater than a certain target value. For the validation of this new theory, an experimental investigation was carried out on GaAs pseudomorphic HEMT devices and demonstrates that high output power and drain efficiency between 75%-83% can be achieved over a wide range of fundamental and second harmonic loads.
Keywords :
III-V semiconductors; gallium arsenide; high electron mobility transistors; power amplifiers; radiofrequency amplifiers; GaAs; GaAs pseudomorphic HEMT device; PA mode; RF power amplifier; continuous class-F mode power amplifier; harmonic impedance; voltage waveform; Harmonic analysis; Impedance; Microwave measurements; Power generation; Power system harmonics; Radio frequency; Semiconductor device measurement; Broadband amplifiers; RF circuits; microwave amplifiers; microwave measurements; power amplifiers (PAs);
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2011.2117435
Filename :
5739131
Link To Document :
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