DocumentCode :
1481345
Title :
New calibration method in electrooptic probing due to wavelength control and Fabry-Perot resonance
Author :
Müller, Philipp O. ; Erasme, Didier ; Huyart, Bernard
Author_Institution :
Dept. Commun. et Electron., Ecole Nat. Superieure des Telecommun., Paris, France
Volume :
47
Issue :
3
fYear :
1999
fDate :
3/1/1999 12:00:00 AM
Firstpage :
308
Lastpage :
314
Abstract :
The use of the Fabry-Perot resonance in direct internal electrooptic probing reveals a new calibration method. Substrate resonances modulated by the Pockels effect results in a direct amplitude modulated electrooptic signal. The relation between this signal amplitude and wavelength-derivative of the reflected average probe-beam intensity describes the absolute potential on the device-under-test (DUT). A fibered electrooptic probing system has been developed containing a fiber reinjection probing head. A confocal arrangement optimizes the spatial resolution on the DUT while respecting the Fabry-Perot resonance limit. The direct AM electrooptic probing under wavelength optimization has been demonstrated experimentally by two-dimensional scanning of a monolithic-microwave integrated-circuit section
Keywords :
Fabry-Perot resonators; MMIC; Pockels effect; calibration; electro-optical modulation; fibre optic sensors; integrated circuit testing; measurement by laser beam; microwave measurement; probes; Fabry-Perot resonance; MMIC section; Pockels effect; absolute potential; amplitude modulated electrooptic signal; calibration method; confocal arrangement; device-under-test; direct AM electrooptic signal; direct electrooptic probing; electrooptic probing; fiber reinjection probing head; fibered electrooptic probing system; monolithic-microwave integrated-circuit; reflected average probe-beam intensity; spatial resolution; substrate resonances; two-dimensional scanning; wavelength control; wavelength optimization; Amplitude modulation; Calibration; Electrooptic modulators; Fabry-Perot; Optical modulation; Optical reflection; Phase modulation; Resonance; Spatial resolution; Substrates;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.750232
Filename :
750232
Link To Document :
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