New calibration method in electrooptic probing due to wavelength control and Fabry-Perot resonance

Author

Müller, Philipp O. ; Erasme, Didier ; Huyart, Bernard

Author_Institution

Dept. Commun. et Electron., Ecole Nat. Superieure des Telecommun., Paris, France

Volume

47

Issue

3

fYear

1999

fDate

3/1/1999 12:00:00 AM

Firstpage

308

Lastpage

314

Abstract

The use of the Fabry-Perot resonance in direct internal electrooptic probing reveals a new calibration method. Substrate resonances modulated by the Pockels effect results in a direct amplitude modulated electrooptic signal. The relation between this signal amplitude and wavelength-derivative of the reflected average probe-beam intensity describes the absolute potential on the device-under-test (DUT). A fibered electrooptic probing system has been developed containing a fiber reinjection probing head. A confocal arrangement optimizes the spatial resolution on the DUT while respecting the Fabry-Perot resonance limit. The direct AM electrooptic probing under wavelength optimization has been demonstrated experimentally by two-dimensional scanning of a monolithic-microwave integrated-circuit section

Keywords

Fabry-Perot resonators; MMIC; Pockels effect; calibration; electro-optical modulation; fibre optic sensors; integrated circuit testing; measurement by laser beam; microwave measurement; probes; Fabry-Perot resonance; MMIC section; Pockels effect; absolute potential; amplitude modulated electrooptic signal; calibration method; confocal arrangement; device-under-test; direct AM electrooptic signal; direct electrooptic probing; electrooptic probing; fiber reinjection probing head; fibered electrooptic probing system; monolithic-microwave integrated-circuit; reflected average probe-beam intensity; spatial resolution; substrate resonances; two-dimensional scanning; wavelength control; wavelength optimization; Amplitude modulation; Calibration; Electrooptic modulators; Fabry-Perot; Optical modulation; Optical reflection; Phase modulation; Resonance; Spatial resolution; Substrates;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.750232

Filename

750232