DocumentCode
1481758
Title
A divided/shared bit-line sensing scheme for ULSI DRAM cores
Author
Hidaka, Hideto ; Matsuda, Yoshio ; Fujishama, K.
Author_Institution
Mitsubishi Electr. Corp., Hyogo, Japan
Volume
26
Issue
4
fYear
1991
fDate
4/1/1991 12:00:00 AM
Firstpage
473
Lastpage
478
Abstract
A new dynamic RAM (DRAM) signal sensing principle, a divided/shared bit-line (DSB) sensing scheme, is proposed. This sensing scheme provides folded bit-line sensing operation in a crosspoint-type memory cell array. The DSB scheme offers a high-density DRAM memory core with the common-mode array noise eliminated. A bit-line architecture based on this new sensing principle and its operation are demonstrated. A divided/pausing bit-line sensing (DIPS) scheme, which is an application of this DSB principle to the conventional folded bit-line type of memory cell arrangement, is also proposed. The DIPS architecture achieves complete pausing states for alternate bit lines throughout the active period. These alternate pausing bit lines shield the inter-bit-line coupling noise between active bit lines. Here the inter-bit-line coupling noise is eliminated by a slight architectural change to the conventional folded bit-line memory cell array. These new memory core design alternatives provide high-density DRAM memory cores suitable for the 64-Mb level and beyond. with the memory array noise reduced significantly
Keywords
DRAM chips; VLSI; 64 Mbit; ULSI DRAM cores; crosspoint-type; divided/pausing bit-line sensing; divided/shared bit-line sensing; dynamic RAM; folded bit-line sensing; high-density DRAM; memory cell array; pausing states; signal sensing principle; Active noise reduction; Electronics packaging; Memory architecture; Noise generators; Noise level; Noise reduction; Random access memory; Ultra large scale integration;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.75041
Filename
75041
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