DocumentCode :
1481841
Title :
A gigabyte-per-second parallel fiber optic network interface for multimedia applications
Author :
Raghavan, B. ; Kim, Y.-G. ; Chuang, T.-Y. ; Madhavan, B. ; Levi, A.F.J.
Author_Institution :
Univ. of Southern California, Los Angeles, CA, USA
Volume :
13
Issue :
1
fYear :
1999
Firstpage :
20
Lastpage :
28
Abstract :
We explore parallel fiber optics and single-chip CMOS interface solutions to support broadband multimedia applications in a small workgroup environment. Initial implementation of a network interface card used in our testbed of Intel Pentium-based PCs is described. The feasibility of a CMOS bridge to parallel optics is demonstrated using on adapter chip implemented in 0.5 μm CMOS technology for a point-to-point configuration and providing a measured peak bandwidth of 4.8 Gb/s on independent transmit and receive directions. In addition, we describe the design of a gigabyte-per-second parallel fiber optic network interface for a slotted ring network currently being developed. We present a medium access control to be implemented on a single CMOS chip The proposed network is a potentially cost-effective solution for small workgroup clusters.
Keywords :
CMOS digital integrated circuits; access protocols; microcomputer applications; multimedia communication; network interfaces; network topology; optical communication equipment; optical fibre LAN; telecommunication computing; transceivers; 0.5 micron; 4.8 Gbit/s; CMOS bridge; CMOS technology; Intel Pentium-based PC; MAC protocol; broadband multimedia applications; gigabyte-per-second network interface; measured peak bandwidth; medium access control; multimedia applications; network interface card; opto-electronic transceiver; parallel fiber optic network interface; parallel optics; point-to-point configuration; single-chip CMOS interface; slotted ring network; small workgroup environment; Bandwidth; Bridges; CMOS technology; Network interfaces; Optical design; Optical fiber networks; Optical fibers; Personal communication networks; Semiconductor device measurement; Testing;
fLanguage :
English
Journal_Title :
Network, IEEE
Publisher :
ieee
ISSN :
0890-8044
Type :
jour
DOI :
10.1109/65.750446
Filename :
750446
Link To Document :
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