Title :
A New Front-End for Binary Data Recovery in EM Polluted Environment
Author :
Bona, Calogero ; Fiori, Franco
Author_Institution :
Dept. of Electron., Polytech. of Turin, Turin, Italy
Abstract :
This paper deals with the susceptibility of input digital front-end to electromagnetic interference (EMI) that, due to the rapid growth of the EM pollution and to the continuous reduction of the supply voltage, has become a major issue in system reliability. In this context, a new digital input front-end highly immune to the radio-frequency interference (RFI) collected by wiring interconnects (e.g., printed circuit board traces). This receiver is able to retrieve the nominal logic value of the transmitted binary data corrupted by EM disturbances and to estimate the EM disturbance amplitude affecting the binary input signal. The effectiveness of the proposed front-end is proved through computer simulations and experimental measurements.
Keywords :
integrated circuit interconnections; integrated circuit reliability; logic circuits; radiofrequency interference; wiring; EM disturbance; EM polluted environment; EM pollution; binary data recovery; computer simulation; digital input front-end; electromagnetic interference; experimental measurement; radio-frequency interference; supply voltage reduction; system reliability; wiring interconnect; Electromagnetic compatibility; Electromagnetic interference; Integrated circuits; Logic gates; Random processes; Receivers; Wiring; Interconnections; interference suppression; noise measurement; reliability; signal detection;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2012.2189039