Title : 
A dynamic three-state memory cell for high-density associative processors
         
        
            Author : 
Herrmann, Frederick P. ; Keast, Craig L. ; Ishio, Keisuke ; Wade, Jon P. ; Sodini, Charles G.
         
        
            Author_Institution : 
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
         
        
        
        
        
            fDate : 
4/1/1991 12:00:00 AM
         
        
        
        
            Abstract : 
A dynamic associative processor cell is described. The cell stores three states (0, 1, and X) and performs read, match, and masked-write functions. Five MOS transistors are used, including two overlapping dual-gate structures available in MIT´s CCD/CMOS technology. Dual-gate CCD transistors are used to reduce the charge-spooning current, which can discharge the storage node through the write transistors. The use of the cell in an associative processor is described, and experimental results are presented
         
        
            Keywords : 
CMOS integrated circuits; charge-coupled device circuits; content-addressable storage; integrated memory circuits; parallel processing; CAM; CAS; CCD/CMOS technology; MOS transistors; dual gate CCD transistors; dynamic three-state memory cell; high-density associative processors; masked-write functions; overlapping dual-gate structures; Associative processing; CMOS technology; Central Processing Unit; Charge coupled devices; MOSFETs; Parallel processing; Random access memory; Read-write memory; Student members; System performance;
         
        
        
            Journal_Title : 
Solid-State Circuits, IEEE Journal of