DocumentCode
1482041
Title
A circuit design of intelligent cache DRAM with automatic write-back capability
Author
Arimoto, Kazutami ; Asakura, Mikio ; Hidaka, Hideto ; Matsuda, Yoshio ; Fujishama, K.
Author_Institution
Mitsubishi Electr. Corp., Itami, Japan
Volume
26
Issue
4
fYear
1991
fDate
4/1/1991 12:00:00 AM
Firstpage
560
Lastpage
565
Abstract
An intelligent cache based on a distributed architecture that consists of a hierarchy of three memory sections-DRAM (dynamic RAM), SRAM (static RAM), and CAM (content addressable memory) as an on-chip tag-is reported. The test device of the memory core is fabricated in a 0.6 μm double-metal CMOS standard DRAM process, and the CAM matrix and control logic are embedded in the array. The array architecture can be applied to 16-Mb DRAM with less than 12% of the chip overhead. In addition to the tag, the array embedded CAM matrix supports a write-back function that provides a short read/write cycle time. The cache DRAM also has pin compatibility with address nonmultiplexed memories. By achieving a reasonable hit ratio (90%), this cache DRAM provides a high-performance intelligent main memory with a 12 ns(hit)/34 ns(average) cycle time and 55 mA (at 25 MHz) operating current
Keywords
CMOS integrated circuits; DRAM chips; buffer storage; content-addressable storage; 0.6 micron; 12 ns; 16 Mbit; 25 MHz; 55 mA; SRAM; access time; array architecture; array embedded CAM matrix; automatic write-back capability; circuit design; content addressable memory; distributed architecture; double-metal CMOS; dynamic RAM; intelligent cache DRAM; pin compatibility; static RAM; Associative memory; CADCAM; Circuit synthesis; Circuit testing; Computer aided manufacturing; DRAM chips; Logic arrays; Logic testing; Random access memory; Read-write memory;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.75055
Filename
75055
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