• DocumentCode
    1482281
  • Title

    Nanostructured semiconductor surfaces induced by an electric field

  • Author

    Kumar, Pranaw

  • Author_Institution
    Chem. & Phys. of Mater. Unit, Jawaharlal Nehru Centre for Adv. Sci. Res., Bangalore, India
  • Volume
    5
  • Issue
    2
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    110
  • Lastpage
    116
  • Abstract
    Surfaces of single crystal [311] silicon, germanium and GaAs were nanostructured by a DC electric field (0.1-1.5-kV/cm). Spark threshold was found to be 1.33, 0.66 and 0.33-kV/cm for GaAs, silicon and germanium, respectively. Field nanostructuring results in the formation of nanoparticles of grain size in the range of 30-200-nm showed the nanoparticle size increasing with the increase in field value. Electric field treatment of the silicon surface gives rise to a lack of long-range crystalline order for surfaces. The effect of such a nanostructuring process is to make more absorbing and surface-oxidised nanocrystalline photoluminescent surfaces. Electric field treatment gives rise to local and directional nanostructuring.
  • Keywords
    III-V semiconductors; electric field effects; elemental semiconductors; gallium arsenide; grain size; light reflection; nanofabrication; nanoparticles; oxidation; photoluminescence; semiconductor growth; silicon; GaAs; Si; directional nanostructuring; grain size; nanoparticle; nanostructured semiconductor; single crystal silicon; spark threshold; surface-oxidised nanocrystalline photoluminescent surfaces;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2010.0007
  • Filename
    5457360