DocumentCode :
1482319
Title :
Nanosecond and sub-nanosecond writing experiments
Author :
Klaassen, Klaas B. ; Van Peppen, Jack C L
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Volume :
35
Issue :
2
fYear :
1999
fDate :
3/1/1999 12:00:00 AM
Firstpage :
625
Lastpage :
631
Abstract :
This paper explores the high speed and high power aspects of fast writing in magnetic data storage. It describes the experimental methods and instrumentation needed to exercise thin-film write heads at excessively large write currents (<0.5 A), short pulse durations (⩾200 ps) and high frequencies (<1 GHz). The instrumentation used is discussed in detail (avalanche pulse generator, head interconnect circuit). The thermal behavior of the head is investigated to ensure that the temperature of the hottest yoke leg (P2) does not exceed 250°C to avoid thermal degradation of the magnetic performance. The paper describes various pulse write, AC-bias write and AC-burst erase methods. As an example, experimental results obtained for an “industry-typical” head are reported and discussed, viz head footprints, saturation curves, write current needed for media magnetization reversal down to 200 ps, write field gradients, write field growth rates, high-frequency head efficiency, current levels needed for AC erasure versus frequency, and AC-bias writing results
Keywords :
magnetic heads; magnetic thin film devices; magnetisation reversal; pulse generators; 200 ps; 250 degC; AC-bias write; AC-bias writing results; AC-burst erase; avalanche pulse generator; head footprints; head interconnect circuit; high-frequency head efficiency; magnetic data storage; media magnetization reversal; pulse durations; pulse write; saturation curves; sub-nanosecond writing experiments; thermal behavior; thermal degradation; thin-film write heads; write current; write currents; write field gradients; write field growth rates; Frequency; Instruments; Integrated circuit interconnections; Magnetic heads; Memory; Pulse generation; Saturation magnetization; Temperature; Thin film circuits; Writing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.750618
Filename :
750618
Link To Document :
بازگشت