• DocumentCode
    1482342
  • Title

    Domain processes and high frequency permeability of laminated Co 91Nb6Zr3/SiO2 narrow strips

  • Author

    Pan, G. ; Mapps, D.J. ; Kirk, K.J. ; Chapman, J.N.

  • Author_Institution
    Sch. of ECEE, Plymouth Univ., UK
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    2857
  • Lastpage
    2859
  • Abstract
    High resolution and real time domain images and magnetisation reversal processes were observed by Lorentz Microscopy with in-situ applied magnetic fields for patterned narrow strips of single layer and double layer CoNbZr films. Results were compared with the initial high frequency permeability measurement of the narrow strips. It was revealed that the domain structures and magnetisation reversal processes were distinctively different at the edge and at the central part of wide strips. The size of the edge domains was typically 3~4 μm-wide. Double walls were observed in dual-layer strips indicating some magnetostatic coupling between sublayers. The easy-axis state was sustained by double layer lamination for 3 μm-wide strips. Distinct magnetisation reversal processes and domain structures were observed for single layer and double layer narrow strips
  • Keywords
    cobalt alloys; electron microscopy; magnetic domains; magnetic multilayers; magnetic permeability; magnetic thin films; magnetisation reversal; niobium alloys; silicon compounds; soft magnetic materials; zirconium alloys; Co91Nb6Zr3-SiO2; Lorentz microscopy; domain structure; double layer film; easy axis; high frequency permeability; high resolution real time imaging; laminated narrow strip; magnetisation reversal; magnetostatic coupling; single layer film; Frequency; Image resolution; Magnetic domains; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetization reversal; Magnetostatics; Permeability measurement; Strips;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.617755
  • Filename
    617755