• DocumentCode
    1482506
  • Title

    Characterization of the head-disk interface at nanometer dimensions

  • Author

    Gupta, B.K. ; Menon, Aric K.

  • Author_Institution
    Read-Rite Corp., Fremont, CA, USA
  • Volume
    35
  • Issue
    2
  • fYear
    1999
  • fDate
    3/1/1999 12:00:00 AM
  • Firstpage
    764
  • Lastpage
    769
  • Abstract
    Characterization of the head and disk surfaces at nanometer dimensions is crucial for optimizing the tribological performance of the head-disk interface as discussed in the following examples given in this paper. Friction mapping at a nano-scale is used to study the nucleation sites of smears on a disk from a failed drive showing high nonrecoverable error rate at the OD. Nanoindentation data suggest that the hardness of the alumina grains is comparable to that of the TiC grains. Al2O3-TiC substrates from vendor B exhibit the lowest hardness of 30 GPa. During the CSS test, sliders with vendor B Al2O3-TiC substrates exhibit relatively greater amount of wear debris and grain pullouts as compared to those of the vendors A and C. The nature of the damage to the DLC coating during nanoscratching can be qualitatively correlated to hardness, toughness, high residual stresses, and weak adhesion due to an impurity at the coating-substrate interface. The correlation between the highest nanowear resistance and best CSS wear performance of DLC coatings indicates that the wear properties at a nanoscale can be used as an indirect measure of the CSS performance of the carbon overcoats
  • Keywords
    friction; magnetic disc storage; magnetic heads; wear; Al2O3-TiC; Al2O3-TiC substrate; C; CSS testing; DLC coating; adhesion; carbon overcoat; error rate; friction mapping; grain pullout; hardness; head-disk interface; impurity; nanoindentation; nanoscratching; nanowear resistance; residual stress; slider; smear nucleation; toughness; tribology; wear debris; Adhesives; Cascading style sheets; Coatings; Drives; Electrical resistance measurement; Error analysis; Friction; Impurities; Residual stresses; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.750642
  • Filename
    750642