The temperature dependence of the low-frequency characteristics of junction field-effect transistors

A discussion is given of the factors determining the temperature dependence of the low-frequency junction field-effect transistor characteristic. The results of measurements of the temperature coefficient of the pinch-off voltage and the channel mobility for a number of 2N3819 and 2N3820 transistors are presented and these are seen to be in disagreement with values that have been assumed previously. The theoretical and practical considerations in obtaining a zero temperature coefficient are discussed in some detail.