• DocumentCode
    1482863
  • Title

    Amorphous silicon thin-film transistors on steel foil substrates

  • Author

    Theiss, S.D. ; Wagner, S.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • Volume
    17
  • Issue
    12
  • fYear
    1996
  • Firstpage
    578
  • Lastpage
    580
  • Abstract
    We report the successful fabrication of high-quality a-Si:H thin-film transistors (TFTs) on stainless steel foil substrates. TFTs with an inverted-staggered structure were grown on 200-μm thick stainless steel foil. These TFTs show typical ON/OFF current ratios of 10/sup 7/, OFF currents on the order of 10/sup -12/ A, good linear and saturation current behavior, subthreshold slopes of 0.5 V/decade, and linear channel mobilities of 0.5 cm2/V. In addition, we have demonstrated that these TFTs are capable of withstanding significant mechanical shocks, as well as macroscopic deformation of the substrate, while remaining functional. This work demonstrates that transistor circuits can be made on a flexible, nonbreakable substrate. Such circuits would be highly useful in reflective or emissive displays, and in other applications that require rugged macroelectronic circuits.
  • Keywords
    amorphous semiconductors; elemental semiconductors; foils; silicon; stainless steel; substrates; thin film transistors; Si:H; amorphous silicon thin-film transistor; fabrication; inverted-staggered structure; macroelectronic circuit; macroscopic deformation; mechanical shock; stainless steel foil substrate; Amorphous silicon; Chromium; Displays; Glass; Iron alloys; Optical films; Plastic films; Steel; Substrates; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.545776
  • Filename
    545776