DocumentCode :
1482972
Title :
Body-bias effect on drain-induced barrier lowering in sphere-shaped-recess cell-array transistor
Author :
Kim, Kunsu ; Jung, K.-H. ; Moon, J.-S. ; Roh, Youngsu
Volume :
48
Issue :
7
fYear :
2012
Firstpage :
366
Lastpage :
367
Abstract :
Sphere-shaped-recess cell-array transistors (S-RCATs) have been playing a major role in DRAMs on the 70 nm design-rule. The S-RCAT has a recessed-channel structure that produces small drain-induced barrier lowering (DIBL) and large body-bias effect. The temperature and body-bias dependence of DIBL is studied for a S-RCAT. Negative DIBL is peculiarly observed under certain conditions. It is assumed that the negative DIBL originates from the increase of body-bias effect with increasing drain bias and temperature.
Keywords :
DRAM chips; integrated circuit design; transistors; DIBL; DRAM; S-RCAT; body-bias effect; drain bias; drain-induced barrier lowering; recessed-channel structure; size 70 nm; sphere-shaped recess cell-array transistor;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2011.4032
Filename :
6177768
Link To Document :
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