• DocumentCode
    1483254
  • Title

    The Thermal Stability of Alkanethiol Self-Assembled Monolayers on Copper for Fluxless Soldering Applications

  • Author

    Ebbens, Stephen ; Hutt, David ; Liu, Changqing

  • Author_Institution
    Dept. of Chem. & Process Eng., Univ. of Sheffield, Sheffield, UK
  • Volume
    33
  • Issue
    2
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    251
  • Lastpage
    259
  • Abstract
    The ability of alkanethiol monolayers deposited on copper to prevent surface oxidation has suggested their application as preservatives for fluxless soldering. However, the utility of such coatings for this purpose will critically depend on their ability to continue to preserve the substrate during exposure to elevated temperatures throughout the electronics manufacturing process. Consequently, the aim of this paper is to systematically determine the effect of storage temperature and duration on the ability of alkanethiol coated copper samples to undergo fluxless soldering. Similarly, the effect of pre-heating copper immediately prior to soldering is also investigated. The effect of reducing atmospheric oxygen concentration during storage and soldering is also considered as a potential route to improve the thermal resilience of the coatings. Parallel to ascertaining these industrially relevant performance parameters, a quantitative correlation between surface chemistry and solder wetting is established, and the temperature dependence of the kinetics of surface oxidation through an alkanethiol barrier layer is discussed.
  • Keywords
    copper; soldering; thermal stability; Cu; alkanethiol self-assembled monolayers; atmospheric oxygen concentration reduction; electronics manufacturing process; fluxless soldering applications; surface oxidation prevention; thermal stability; Copper; fluxless-soldering; oxidation; printed circuit boards; self-assembled monolayers;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2010.2041779
  • Filename
    5457996