DocumentCode
1483284
Title
Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference
Author
Yeary, Mark ; Van Moer, Wendy
Volume
60
Issue
5
fYear
2011
fDate
5/1/2011 12:00:00 AM
Firstpage
1503
Lastpage
1504
Abstract
The 46 papers in this special issue were originally presented at the 2010 IEEE International Instrumentation and Measurement Conference, held in Austin, TX, on May 3-6, 2010.
Keywords
Instrumentation and measurement; Meetings; Special issues and sections;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2011.2114530
Filename
5740347
Link To Document