DocumentCode
1483739
Title
A 200 mW, 1 Msample/s, 16-b pipelined A/D converter with on-chip 32-b microcontroller
Author
Mayes, Michael K. ; Chin, Sing W.
Author_Institution
Nat. Semicond. Corp., Santa Clara, CA, USA
Volume
31
Issue
12
fYear
1996
fDate
12/1/1996 12:00:00 AM
Firstpage
1862
Lastpage
1872
Abstract
This paper describes the design and implementation of a fully monolithic 16-b, 1 Msample/s, low-power A/D converter (ADC). An on-chip 32-b custom microcontroller calibrates and corrects the pipeline linearity to within 0.75 LSB integral nonlinearity (INL) and 0.6 LSB differential nonlinearity (DNL). High speed and low power are achieved using a pipelined architecture. Errors resulting from capacitor mismatches, finite op-amp open loop gain, charge injection and comparator offset are removed through self-calibration. Coefficients determined during calibration are stored on chip, digitally correcting the pipeline ADC in real time during normal conversion, Full-scale errors are removed through self-calibration and an-chip multiplication. Linearity errors due to capacitor voltage coefficients are reduced using a curve fit algorithm and on-chip ROM. Digital cross-talk errors resulting from the microcontroller running at a rate of ten times the analog sampling rate have prevented implementations of fully monolithic converters of this performance class in the past. Mismatches in cross-talk due to different digital timing between calibration and correction lead to linearity errors at critical correction points. Experimental analysis and circuit techniques which overcome these problems are presented
Keywords
BiCMOS integrated circuits; analogue-digital conversion; calibration; crosstalk; error correction; microcontrollers; pipeline processing; timing; 16 bit; 200 mW; 32 bit; BiCMOS process; capacitor voltage coefficients; curve fit algorithm; custom microcontroller; digital crosstalk errors; digital timing; error removal; fully monolithic converters; high speed operation; linearity errors; low power design; monolithic ADC; onchip ROM; onchip microcontroller; pipeline linearity calibration; pipeline linearity correction; pipelined A/D converter; pipelined architecture; self-calibration; Calibration; Capacitors; Error correction; Linearity; Microcontrollers; Operational amplifiers; Pipelines; Read only memory; Sampling methods; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.545806
Filename
545806
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