• DocumentCode
    1483739
  • Title

    A 200 mW, 1 Msample/s, 16-b pipelined A/D converter with on-chip 32-b microcontroller

  • Author

    Mayes, Michael K. ; Chin, Sing W.

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara, CA, USA
  • Volume
    31
  • Issue
    12
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    1862
  • Lastpage
    1872
  • Abstract
    This paper describes the design and implementation of a fully monolithic 16-b, 1 Msample/s, low-power A/D converter (ADC). An on-chip 32-b custom microcontroller calibrates and corrects the pipeline linearity to within 0.75 LSB integral nonlinearity (INL) and 0.6 LSB differential nonlinearity (DNL). High speed and low power are achieved using a pipelined architecture. Errors resulting from capacitor mismatches, finite op-amp open loop gain, charge injection and comparator offset are removed through self-calibration. Coefficients determined during calibration are stored on chip, digitally correcting the pipeline ADC in real time during normal conversion, Full-scale errors are removed through self-calibration and an-chip multiplication. Linearity errors due to capacitor voltage coefficients are reduced using a curve fit algorithm and on-chip ROM. Digital cross-talk errors resulting from the microcontroller running at a rate of ten times the analog sampling rate have prevented implementations of fully monolithic converters of this performance class in the past. Mismatches in cross-talk due to different digital timing between calibration and correction lead to linearity errors at critical correction points. Experimental analysis and circuit techniques which overcome these problems are presented
  • Keywords
    BiCMOS integrated circuits; analogue-digital conversion; calibration; crosstalk; error correction; microcontrollers; pipeline processing; timing; 16 bit; 200 mW; 32 bit; BiCMOS process; capacitor voltage coefficients; curve fit algorithm; custom microcontroller; digital crosstalk errors; digital timing; error removal; fully monolithic converters; high speed operation; linearity errors; low power design; monolithic ADC; onchip ROM; onchip microcontroller; pipeline linearity calibration; pipeline linearity correction; pipelined A/D converter; pipelined architecture; self-calibration; Calibration; Capacitors; Error correction; Linearity; Microcontrollers; Operational amplifiers; Pipelines; Read only memory; Sampling methods; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.545806
  • Filename
    545806