Signed and Accurate Measurement of Phase Offset in Optical DPSK Demodulator

Author

Zhao, Jian ; Lau, Alan Pak Tao ; Lu, Chao ; Tam, H.Y. ; Wai, P.K.A.

Author_Institution

Sch. of Comput. & Commun. Eng., Tianjin Univ. of Technol., Tianjin, China

Volume

22

Issue

14

fYear

2010

fDate

7/15/2010 12:00:00 AM

Firstpage

1018

Lastpage

1020

Abstract

Abstract-A signed and accurate phase offset estimation method of the delay interferometer (DI) for the direct detection differential phase-shift keying system based on a delay-tap sampling technique has been demonstrated. A chromatic dispersion offset module was introduced to help the phase offset measurement. The proposed method can not only measure the value but also distinguish the polarity of phase offset of DI. The measurement sensitivity can reach ±4° and measurement range can reach ±75°. The simulation and experimental measurement results are in close agreement with each other.

Keywords

differential phase shift keying; light interferometry; optical dispersion; delay interferometer; delay-tap sampling technique; direct detection; measurement sensitivity; optical DPSK demodulator; phase offset estimation method; Chromatic dispersion (CD); delay interferometer (DI); delay-tap sampling; differential phase-shift keying (DPSK); optical fiber communication; performance monitoring; phase offset;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2010.2049012

Filename

5458064