Virtual test reduces semiconductor product development time

Author

Hogan, T. ; Heffernan, D.

Author_Institution

Dept. of Electron. & Comput. Eng., Limerick Univ., Ireland

Volume

13

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

77

Lastpage

83

Abstract

In the semiconductor industry´s evolutionary life cycle, the speed at which products are introduced to the market-place is key to the competitive success of individual companies. The semiconductor industry is classed as a fast-changing industry in which product technology, manufacturing process technology and industry organisation need to be continuously updated in relatively short cycle times. This paper looks at the test engineering aspect of the IC (integrated circuit) product development process and describes how an emerging `virtual test´ methodology can be effectively applied to reduce the overall product development time for semiconductor devices

Keywords

integrated circuit manufacture; integrated circuit testing; product development; semiconductor device testing; virtual instrumentation; IC product development; industry organisation; integrated circuit product development; manufacturing process technology; product technology; semiconductor devices; semiconductor industry; semiconductor product development time reduction; test engineering; virtual test;

fLanguage

English

Journal_Title

Electronics & Communication Engineering Journal

Publisher

iet

ISSN

0954-0695

Type

jour

DOI

10.1049/ecej:20010205

Filename

920679