• DocumentCode
    1483946
  • Title

    Analysis of water trees in underground HV cables using the KFUPM micro-PIXE facility

  • Author

    Ahmed, M. ; Al-Ohali, M.A. ; Garwan, M.A. ; Al-Soufi, K. ; Narasimhan, S.

  • Author_Institution
    Centre for Applied Phys. Scis., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
  • Volume
    6
  • Issue
    1
  • fYear
    1999
  • fDate
    2/1/1999 12:00:00 AM
  • Firstpage
    95
  • Lastpage
    99
  • Abstract
    Scanning with the micro-PIXE technique was employed to analyze water trees in the XLPE insulation of a field-aged underground HV cable. X-ray spectra of bow tie and vented water trees, the inner and outer semiconductive compounds, and an insulation spot free from any water tree were acquired. Simultaneously, two-dimensional elemental distribution profiles across the water trees were also measured. Various trace element impurities were identified in the analyzed spots and their possible sources are suggested. Differences in elemental distribution profiles in the scanned areas were observed and have been discussed on the basis of the mechanism of incorporation of these elements into the insulation. This study demonstrates the effectiveness of the micro-PIXE facility available in this laboratory in analyzing water trees in underground power cables
  • Keywords
    X-ray chemical analysis; XLPE insulation; ageing; power cable insulation; power cable testing; trees (electrical); underground cables; underground transmission systems; KFUPM micro-PIXE facility; X-ray spectra; XLPE insulation; bow tie water trees; field-aged power cable; inner semiconductive compounds; outer semiconductive compounds; trace element impurities; two-dimensional elemental distribution profiles; underground HV cables; vented water trees; water trees; Cable insulation; Electric breakdown; Impurities; Laboratories; Microscopy; Minerals; Sea measurements; Trees - insulation; Underground power cables; Underwater cables;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.752015
  • Filename
    752015