DocumentCode :
1483949
Title :
Filter-Less Amplification for Rapid Swept-Wavelength Interferometric Measurement of Silicon Waveguide Group Delay Statistics
Author :
Cooper, Michael L. ; Schneider, Mark A. ; Gupta, Greeshma ; Mookherjea, Shayan
Author_Institution :
Univ. of California, La Jolla, CA, USA
Volume :
23
Issue :
12
fYear :
2011
fDate :
6/15/2011 12:00:00 AM
Firstpage :
783
Lastpage :
785
Abstract :
In the context of rapid and high-resolution swept-wavelength interferometric measurement of dispersion properties of silicon nanophotonic devices, we show that filter-less optical amplification does not perturb the measured statistical distributions of group delay. The scaling behavior of group delay ripple with detected power is also shown to be identical for the unamplified and filter-less amplified cases.
Keywords :
elemental semiconductors; nanophotonics; optical fibre amplifiers; optical waveguides; silicon; statistical distributions; Si; dispersion properties; filter-less optical amplification; group delay ripple; rapid swept-wavelength interferometric measurement; scaling behavior; silicon nanophotonic devices; silicon waveguide; statistical distributions; Delay; Noise; Optical interferometry; Optical variables measurement; Optical waveguides; Power measurement; Wavelength measurement; Integrated nanophotonic systems; optical interconnects; silicon nanophotonics; waveguide devices;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2011.2134842
Filename :
5740574
Link To Document :
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