Filter-Less Amplification for Rapid Swept-Wavelength Interferometric Measurement of Silicon Waveguide Group Delay Statistics

Author

Cooper, Michael L. ; Schneider, Mark A. ; Gupta, Greeshma ; Mookherjea, Shayan

Author_Institution

Univ. of California, La Jolla, CA, USA

Volume

23

Issue

12

fYear

2011

fDate

6/15/2011 12:00:00 AM

Firstpage

783

Lastpage

785

Abstract

In the context of rapid and high-resolution swept-wavelength interferometric measurement of dispersion properties of silicon nanophotonic devices, we show that filter-less optical amplification does not perturb the measured statistical distributions of group delay. The scaling behavior of group delay ripple with detected power is also shown to be identical for the unamplified and filter-less amplified cases.

Keywords

elemental semiconductors; nanophotonics; optical fibre amplifiers; optical waveguides; silicon; statistical distributions; Si; dispersion properties; filter-less optical amplification; group delay ripple; rapid swept-wavelength interferometric measurement; scaling behavior; silicon nanophotonic devices; silicon waveguide; statistical distributions; Delay; Noise; Optical interferometry; Optical variables measurement; Optical waveguides; Power measurement; Wavelength measurement; Integrated nanophotonic systems; optical interconnects; silicon nanophotonics; waveguide devices;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2011.2134842

Filename

5740574