Title :
Nanostructure patterning
Author :
Marrian, Christie R.K. ; Dobisz, Elizabeth A. ; Peckerar, M.C.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fDate :
8/1/1991 12:00:00 AM
Abstract :
Research at the US Naval Research Laboratory (NRL) in the lithography, patterning, and fabrication of structures of nanometer scale dimensions is reviewed. Electron-beam (e-beam) lithography at high (50 keV) and low (5 eV) energies on resist systems developed at NRL is described. The low energy lithography takes advantage of the spatially confined e-beam available in a scanning tunneling microscope type probe. This instrument allows an in situ exposure and characterization of an e-beam sensitive material. A novel approach for implementing dose correction for proximity effects in e-beam lithography is presented using an error measure based on the physical realities of lithography. The compositional disordering of GaAs-GaxAl1-xAs heterostructures as a technique for pattern replication is described. Introducing silicon into the heterostructure (by implantation or diffusion) enhances the aluminum and gallium interdiffusion which can be used for patterning. A complete bibliography of recently published results is included
Keywords :
electron beam lithography; electron resists; integrated circuit technology; semiconductor technology; 5 eV; 50 keV; GaAs-GaxAl1-xAs heterostructures; NRL; compositional disordering; dose correction; error measure; fabrication; lithography; low energy lithography; nanometer scale dimensions; nanostructure patterning; pattern replication; proximity effects; resist systems; scanning tunneling microscope type probe; Fabrication; Instruments; Laboratories; Lithography; Microscopy; Nanostructures; Probes; Proximity effect; Resists; Tunneling;
Journal_Title :
Proceedings of the IEEE