• DocumentCode
    1484327
  • Title

    Exact Closed-Form BER Analysis of OFDM Systems in the Presence of IQ Imbalances and ICSI

  • Author

    López-Martínez, F. Javier ; Martos-Naya, Eduardo ; Paris, José F. ; Entrambasaguas, J. Tomás

  • Author_Institution
    Commun. Eng. Dept., Univ. of Malaga, Malaga, Spain
  • Volume
    10
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1914
  • Lastpage
    1922
  • Abstract
    In this paper, we derive an exact closed-form expression for the bit error rate (BER) of orthogonal frequency division multiplexing (OFDM) systems impaired by transmit (TX) and receive (RX) in-phase/quadrature (IQ) imbalances and imperfect channel state information (ICSI), in Rayleigh fading channels. Since the decision metric in this scenario can be expressed as a quadratic form D in Gaussian complex-valued non-circularly symmetric random variables (RVs) with zero mean, we provide a general expression for the calculation of Pr{D <; 0}. In addition, two approximate closed-form expressions for the BER are obtained, which are demonstrated to be extremely accurate for practical values of IQ imbalances. Results show that TX IQ imbalance is in general less detrimental than RX IQ imbalance, and confirm that the correlation between the channel response at the observed subcarrier frequency and the mirror subcarrier has a significant impact in the BER.
  • Keywords
    Gaussian channels; OFDM modulation; Rayleigh channels; channel estimation; error statistics; BER; Gaussian variables; ICSI; IQ imbalances; OFDM; Rayleigh fading channels; bit error rate; channel response; channel state information; closed form expression; in-phase-quadrature imbalances; orthogonal frequency division multiplexing; random variables; Bit error rate; Channel estimation; Closed-form solution; Covariance matrix; Fading; OFDM; Receivers; BER; IQ imbalance; OFDM; Rayleigh fading; channel estimation errors; correlation;
  • fLanguage
    English
  • Journal_Title
    Wireless Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-1276
  • Type

    jour

  • DOI
    10.1109/TWC.2011.032411.101356
  • Filename
    5740630