• DocumentCode
    1484360
  • Title

    A technique for standing wave measurements of pulse-biased semiconductor devices

  • Author

    Martin, B. ; Hobson, G.S.

  • Volume
    41
  • Issue
    12
  • fYear
    1971
  • fDate
    12/1/1971 12:00:00 AM
  • Firstpage
    538
  • Lastpage
    540
  • Abstract
    A coherent sampling technique is described by which the v.s.w.r. of a pulse-biased semiconductor device mounted in a transmissio line may be measured with a sensitivity comparable to that obtainable in c.w. measurements.
  • Keywords
    high-frequency transmission line measurements; microwave measurement; semiconductor devices; standing wave meters; coherent sampling; high sensitivity; microwave measurements; pulse biased semiconductor device; standing wave measurements;
  • fLanguage
    English
  • Journal_Title
    Radio and Electronic Engineer
  • Publisher
    iet
  • ISSN
    0033-7722
  • Type

    jour

  • DOI
    10.1049/ree.1971.0175
  • Filename
    5269413
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1484360