Title :
Measurement and selection of low noise avalanche diodes
fDate :
10/1/1971 12:00:00 AM
Abstract :
This paper describes an investigation into methods of testing diodes to find those with a predictable and stable noise level, and further describes the noise characteristics of some diodes selected by these methods.
Keywords :
avalanche diodes; noise; semiconductor device testing; avalanche diodes; noise characteristics; noise level; testing;
Journal_Title :
Radio and Electronic Engineer
DOI :
10.1049/ree.1971.0138
