• DocumentCode
    1484453
  • Title

    Quantum mechanical aspects of transport in nanoelectronics

  • Author

    Timp, Gregory L. ; Howard, Richard E.

  • Author_Institution
    AT&T Bell Labs., Holmdel, NJ, USA
  • Volume
    79
  • Issue
    8
  • fYear
    1991
  • fDate
    8/1/1991 12:00:00 AM
  • Firstpage
    1188
  • Lastpage
    1207
  • Abstract
    The authors discuss some of the effects quantum mechanics has on the performance of nanometer-scale devices. At low temperature, the confinement and the coherence of the electronic motion on the scale of the electron wavelength give rise to gross deviations from classical charge transport that describes the resistance found in large conventional devices. The authors examine three examples of the quantum mechanical nature of the resistance of a split-gate MODFET, that are not accounted for in conventional classical models of a FET, and yet may influence device speed, noise performance and device isolation. The authors consider the temperature and electric field ranges where quantum mechanical effects are manifested in the charge transport, and speculate about the conditions in which parasitic quantum mechanical effects might be found in a conventional device
  • Keywords
    carrier mobility; contact resistance; electron device noise; field effect integrated circuits; high electron mobility transistors; impurity scattering; semiconductor device models; charge transport; coherent impurity scattering; device isolation; device speed; electric field ranges; electron wavelength; low temperature; models; nanoelectronics; nanometer-scale devices; noise performance; quantum mechanical effects; split-gate MODFET; Coherence; Electric resistance; Electrons; HEMTs; MODFETs; Nanoelectronics; Nanoscale devices; Quantum mechanics; Split gate flash memory cells; Temperature;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.92077
  • Filename
    92077