DocumentCode
1484453
Title
Quantum mechanical aspects of transport in nanoelectronics
Author
Timp, Gregory L. ; Howard, Richard E.
Author_Institution
AT&T Bell Labs., Holmdel, NJ, USA
Volume
79
Issue
8
fYear
1991
fDate
8/1/1991 12:00:00 AM
Firstpage
1188
Lastpage
1207
Abstract
The authors discuss some of the effects quantum mechanics has on the performance of nanometer-scale devices. At low temperature, the confinement and the coherence of the electronic motion on the scale of the electron wavelength give rise to gross deviations from classical charge transport that describes the resistance found in large conventional devices. The authors examine three examples of the quantum mechanical nature of the resistance of a split-gate MODFET, that are not accounted for in conventional classical models of a FET, and yet may influence device speed, noise performance and device isolation. The authors consider the temperature and electric field ranges where quantum mechanical effects are manifested in the charge transport, and speculate about the conditions in which parasitic quantum mechanical effects might be found in a conventional device
Keywords
carrier mobility; contact resistance; electron device noise; field effect integrated circuits; high electron mobility transistors; impurity scattering; semiconductor device models; charge transport; coherent impurity scattering; device isolation; device speed; electric field ranges; electron wavelength; low temperature; models; nanoelectronics; nanometer-scale devices; noise performance; quantum mechanical effects; split-gate MODFET; Coherence; Electric resistance; Electrons; HEMTs; MODFETs; Nanoelectronics; Nanoscale devices; Quantum mechanics; Split gate flash memory cells; Temperature;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/5.92077
Filename
92077
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