DocumentCode :
1484570
Title :
Numerical model for electrical charge injection in the acoustic charge-transport device
Author :
Bogus, Edward G. ; Hoskins, Michael J. ; Hunsinger, Bill J.
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Volume :
38
Issue :
4
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
822
Lastpage :
830
Abstract :
A two dimensional model is developed to study the electrical charge injection process at the input of a GaAs buried-channel acoustic charge-transport device. The model allows for nonuniform impurity doping profiles, variable epitaxial layer configurations, and arbitrary structural designs of the input electrode architecture. The acoustic wave potential is incorporated as a time- and space-varying doping density that adds directly to the impurity doping density. The wave-induced doping density is obtained from the piezoelectric displacement charge that accompanies the acoustic wave. The partial differential equations which form the mathematical basis of the charge injection process are derived from the semiconductor transport equations and solved numerically. The algorithm for simulating charge injection and the results of a simulation are presented. This model provides a means for characterizing the electrical performance of the acoustic charge-transport device input circuit in terms of device physics
Keywords :
III-V semiconductors; charge-coupled devices; doping profiles; gallium arsenide; semiconductor epitaxial layers; surface acoustic wave devices; GaAs; acoustic charge-transport device; acoustic wave potential; electrical charge injection; input electrode architecture; nonuniform impurity doping profiles; partial differential equations; piezoelectric displacement charge; semiconductor transport equations; space-varying doping density; time-varying doping density; two dimensional model; variable epitaxial layer configurations; Acoustic devices; Acoustic waves; Circuit simulation; Doping profiles; Gallium arsenide; Impurities; Numerical models; Partial differential equations; Semiconductor device doping; Semiconductor process modeling;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.75212
Filename :
75212
Link To Document :
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