• DocumentCode
    1484680
  • Title

    Damping constants of Co-Cr-Ta and Co-Cr-Pt thin films

  • Author

    Inaba, N. ; Uesaka, Y. ; Nakamura, A. ; Futamoto, M. ; Sugita, Y. ; Narishige, S.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Kokubunji, Japan
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • Firstpage
    2989
  • Lastpage
    2991
  • Abstract
    Gilbert´s damping constants, α , of Co-Cr-Ta and Co-Cr-Pt thin films are determined by Q-band FMR analysis using single crystal magnetic thin films epitaxialIy grown on MgO(110) substrates. α is calculated from the resonance width of the FMR spectrum. α of Co77Cr19Ta4 is found to increase from 0.016 to 0.028 as magnetic layer thickness increases from 25 to 240 nm. α also increases from 0.009 to 0.019 when the Cr concentration in the 60 nm thick Co96-x CrxTa4 magnetic layer is increased from 8 to 19 at.%. The 25 nm thick Co81Cr15Pt4, film has a 2.5 times larger α value (0.038) than the Co81Cr15Ta4 film (α = 0.014) with the same thickness.
  • Keywords
    chromium alloys; cobalt alloys; damping; ferromagnetic resonance; magnetic epitaxial layers; platinum alloys; tantalum alloys; Co-Cr-Pt; Co-Cr-Ta; Gilbert damping constant; Q-band FMR; epitaxial growth; single crystal magnetic thin film; Chromium; Damping; Magnetic analysis; Magnetic films; Magnetic resonance; Substrates; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.617820
  • Filename
    617820