Thermal stability of narrow track bits in a 5 Gbit/in² medium

Author

Abarra, E.N. ; Suzuki, T.

Author_Institution

Lab. of Inf. Storage Mater., Toyota Technol. Inst., Nagoya, Japan

Volume

33

Issue

5

fYear

1997

fDate

9/1/1997 12:00:00 AM

Firstpage

2995

Lastpage

2997

Abstract

The thermal stability of high density written bits in a 5 Gbit/in ² CoCrPtTa/CrMo medium is examined using a magnetic force microscope. Images of the same 0.8 μm-track all-ones pattern were taken before and after various anneal schedules. Written bits, which for the measured magneto-crystalline anisotropy and switching volume, are predicted by simulation studies to be thermally unstable reveal no significant degradation with annealing up to 490 K for 2 hours. This discrepancy emphasizes the need for more realistic theoretical models

Keywords

annealing; chromium alloys; cobalt alloys; ferromagnetic materials; grain size; magnetic anisotropy; magnetic force microscopy; magnetic recording; molybdenum alloys; platinum alloys; tantalum alloys; thermal stability; 0.8 micron; 2 h; 490 K; CoCrPtTa-CrMo; all-ones pattern; anneal schedules; grain size; high density written bits; magnetic force microscope; magnetic recording media; magneto-crystalline anisotropy; narrow track bits; switching volume; thermal stability; Anisotropic magnetoresistance; Annealing; Magnetic anisotropy; Magnetic force microscopy; Magnetic forces; Magnetic switching; Perpendicular magnetic anisotropy; Thermal force; Thermal stability; Volume measurement;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.617822

Filename

617822

Thermal stability of narrow track bits in a 5 Gbit/in2 medium

Abarra, E.N. ; Suzuki, T.

jour

Thermal stability of narrow track bits in a 5 Gbit/in² medium