Surface Charge Density Measurements

This paper is devoted to the Kelvin probe technique which is noncontacting method for the quantitative evaluation of an electric field, surface potential, and surface charge distribution. It does not change the physical state of the object under test. Lack of contact with the measured object assures that there is no charge transfer between the meter and the tested surface. This article investigates the uses and limitations of Kelvin probe-based instruments for surface charge density measurements of dielectric materials.