DocumentCode :
1485326
Title :
Computing Multi-State Two-Terminal Reliability Through Critical Arc States That Interrupt Demand
Author :
Jane, Chin-Chia ; Laih, Yih-Wenn
Author_Institution :
Dept. of Inf. Manage., Ling Tung Univ., Taichung, Taiwan
Volume :
59
Issue :
2
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
338
Lastpage :
345
Abstract :
A variety of algorithms have been proposed to compute the NP-hard multi-state two-terminal reliability at demand level d (MS2TRd). Most of the methods solve the problem in terms of two to three NP-hard sub-problems. The only existing method that computes MS2TRd without requiring all multi-state minimal paths or cuts a priori, excluding the impractical complete enumeration method, and Doulliez & Jamoulle´s popular but incorrect decomposition method, see P. Doulliez and E. Jamoulle, “Transportation networks with random arc capacities,” RAIRO, vol. 3, pp. 45-60, 1972, is the decomposition method proposed by Jane & Laih, see C.-C. Jane and Y.-W. Laith, “A practical algorithm for computing multi-state two-terminal reliability,” IEEE Trans. Reliability, vol. 57, pp. 295-302, 2008, recently. In contrast to Jane & Laih´s method that computes MS2TRd in term of d-flows, this paper presents a novel decomposition method that computes 1-MS2TRd in terms of d-cuts. Contribution of the proposed method is that it is the first unique method that computes MS2TRd by way of cut sets without requiring all multi-state minimal paths or cuts a priori. An example illustrates the proposed algorithm. In addition, we make computational comparisons between the two algorithms in terms of d-flows, and d-cuts.
Keywords :
computational complexity; reliability theory; IEEE multistate two terminal reliability; NP hard sub problems; critical arc states; decomposition method; $d$-cut; decomposition algorithm; multi-state network;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2010.2046805
Filename :
5460899
Link To Document :
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