Title :
Antiguided array diode lasers fabricated with modulated cap thin p-clad structure
Author :
O, J.S. ; Zory, J.S.O.P. ; Schwartz, B.D. ; Setzko, R.S. ; Emanuel, M.A. ; Sperry, V.R.
Author_Institution :
Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
fDate :
4/1/1999 12:00:00 AM
Abstract :
Antiguided array lasers were fabricated in thin p-clad, InGaAs-GaAs single quantum-well material. The required lateral refractive index variation was achieved by precisely modulating the thickness of the GaAs cap layer using a novel pulsed anodization/etching technique. Edge-emitting arrays having 20 lasers on 7-μm centers with 5-μm-wide gain regions were characterized. At 1.2 times the pulsed current threshold (I/sub th/), the central lobe of the lateral far field of the arrays contained about 75% of the beam power and was about twice the diffraction limit (FWHM=0.8/spl deg/). At 10×I/sub th/, the central lobe contained about 60% of the beam power and was about 1.6/spl deg/ wide.
Keywords :
III-V semiconductors; claddings; gallium arsenide; indium compounds; laser beams; optical fabrication; quantum well lasers; refractive index; semiconductor laser arrays; 5 mum; 7 mum; GaAs cap layer; InGaAs-GaAs; InGaAs-GaAs single quantum-well laser; InGaAs-GaAs single quantum-well material; antiguided array diode laser fabrication; beam power; central lobe; diffraction limit; edge-emitting arrays; gain regions; lateral far field; lateral refractive index variation; modulated cap thin p-clad structure; pulsed anodization/etching technique; pulsed current threshold; Diode lasers; Etching; Gallium arsenide; Laser beams; Optical arrays; Optical materials; Pulse modulation; Quantum well lasers; Refractive index; Semiconductor laser arrays;
Journal_Title :
Photonics Technology Letters, IEEE