DocumentCode :
1485665
Title :
Characterizing Vulnerability of Network Interfaces in Embedded Chip Multiprocessors
Author :
Zou, Yong ; Xiang, Yi ; Pasricha, Sudeep
Author_Institution :
Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
Volume :
4
Issue :
2
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
41
Lastpage :
44
Abstract :
In Networks-on-Chip (NoC), with ever-increasing design complexity and technology scaling, soft errors have become a key design challenge. In this work, we extend the concept of architectural vulnerability factor (AVF) from the microprocessor domain and propose a network vulnerability factor (NVF) to characterize the susceptibility of Network Interfaces (NIs) to soft errors. For the first time, a detailed characterization of vulnerability is performed on a state-of-the-art AXI-based NI architecture using full system simulation. Our studies reveal that different NI buffers behave quite differently in the presence of transient faults and each buffer can have different inherent tolerance to faults. Our analysis also considers the impact of thermal hotspot mitigation techniques on the NVF estimation.
Keywords :
embedded systems; microprocessor chips; multiprocessing systems; network-on-chip; architectural vulnerability factor; design complexity; embedded chip multiprocessor; microprocessor domain; network interfaces; network vulnerability factor; networks-on-chip; soft errors; susceptibility; technology scaling; thermal hotspot mitigation; transient fault; Buffer storage; Computer architecture; Network interfaces; Nickel; Protocols; Reliability engineering; Fault tolerance; network interface; networks-on-chip;
fLanguage :
English
Journal_Title :
Embedded Systems Letters, IEEE
Publisher :
ieee
ISSN :
1943-0663
Type :
jour
DOI :
10.1109/LES.2012.2193553
Filename :
6178769
Link To Document :
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