DocumentCode
1485665
Title
Characterizing Vulnerability of Network Interfaces in Embedded Chip Multiprocessors
Author
Zou, Yong ; Xiang, Yi ; Pasricha, Sudeep
Author_Institution
Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
Volume
4
Issue
2
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
41
Lastpage
44
Abstract
In Networks-on-Chip (NoC), with ever-increasing design complexity and technology scaling, soft errors have become a key design challenge. In this work, we extend the concept of architectural vulnerability factor (AVF) from the microprocessor domain and propose a network vulnerability factor (NVF) to characterize the susceptibility of Network Interfaces (NIs) to soft errors. For the first time, a detailed characterization of vulnerability is performed on a state-of-the-art AXI-based NI architecture using full system simulation. Our studies reveal that different NI buffers behave quite differently in the presence of transient faults and each buffer can have different inherent tolerance to faults. Our analysis also considers the impact of thermal hotspot mitigation techniques on the NVF estimation.
Keywords
embedded systems; microprocessor chips; multiprocessing systems; network-on-chip; architectural vulnerability factor; design complexity; embedded chip multiprocessor; microprocessor domain; network interfaces; network vulnerability factor; networks-on-chip; soft errors; susceptibility; technology scaling; thermal hotspot mitigation; transient fault; Buffer storage; Computer architecture; Network interfaces; Nickel; Protocols; Reliability engineering; Fault tolerance; network interface; networks-on-chip;
fLanguage
English
Journal_Title
Embedded Systems Letters, IEEE
Publisher
ieee
ISSN
1943-0663
Type
jour
DOI
10.1109/LES.2012.2193553
Filename
6178769
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