• DocumentCode
    1485665
  • Title

    Characterizing Vulnerability of Network Interfaces in Embedded Chip Multiprocessors

  • Author

    Zou, Yong ; Xiang, Yi ; Pasricha, Sudeep

  • Author_Institution
    Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
  • Volume
    4
  • Issue
    2
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    In Networks-on-Chip (NoC), with ever-increasing design complexity and technology scaling, soft errors have become a key design challenge. In this work, we extend the concept of architectural vulnerability factor (AVF) from the microprocessor domain and propose a network vulnerability factor (NVF) to characterize the susceptibility of Network Interfaces (NIs) to soft errors. For the first time, a detailed characterization of vulnerability is performed on a state-of-the-art AXI-based NI architecture using full system simulation. Our studies reveal that different NI buffers behave quite differently in the presence of transient faults and each buffer can have different inherent tolerance to faults. Our analysis also considers the impact of thermal hotspot mitigation techniques on the NVF estimation.
  • Keywords
    embedded systems; microprocessor chips; multiprocessing systems; network-on-chip; architectural vulnerability factor; design complexity; embedded chip multiprocessor; microprocessor domain; network interfaces; network vulnerability factor; networks-on-chip; soft errors; susceptibility; technology scaling; thermal hotspot mitigation; transient fault; Buffer storage; Computer architecture; Network interfaces; Nickel; Protocols; Reliability engineering; Fault tolerance; network interface; networks-on-chip;
  • fLanguage
    English
  • Journal_Title
    Embedded Systems Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0663
  • Type

    jour

  • DOI
    10.1109/LES.2012.2193553
  • Filename
    6178769