2-dimensional numerical analysis of laminated thin film elements

Author

Yoo, H.Y. ; Pohm, A.V. ; Comstock, C.S.

Author_Institution

Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA

Volume

24

Issue

6

fYear

1988

fDate

11/1/1988 12:00:00 AM

Firstpage

2377

Lastpage

2379

Abstract

A theoretical analysis of the laminated thin film elements is carried out by solving the micromagnetic equation. The boundary conditions of the equation are obtained by assuming that the magnetization is pinned at the edges of the elements. The dimension of the element is 2 μm×20 μm, with 150-Å-thick magnetic layers and a 50-Å-thick nonmagnetic layer. For the numerical analysis each magnetic layer is divided into 40×100 segments. The demagnetizing field is obtained by integrating the surface poles generated at the boundaries of the elements. Two different element shapes are considered: rectangular and diamond. Each shape is solved with its anisotropy constant either parallel or perpendicular to the long dimension of the element

Keywords

boundary-value problems; demagnetisation; magnetic anisotropy; magnetic thin films; magnetisation; 150 A; 50 A; anisotropy constant; boundary conditions; demagnetizing field; diamond; element shapes; laminated thin film elements; magnetic layers; magnetization; micromagnetic equation; nonmagnetic layer; rectangular; surface poles; Boundary conditions; Equations; Magnetic analysis; Magnetic anisotropy; Magnetization; Micromagnetics; Numerical analysis; Perpendicular magnetic anisotropy; Shape; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92114

Filename

92114