DocumentCode :
1485990
Title :
Aggressive Runtime Leakage Control Through Adaptive Light-Weight V_{\\rm th} Hopping With Temperature and Process Variation
Author :
Xu, Hao ; Jone, Wen-Ben ; Vemuri, Ranga
Author_Institution :
Dept. of Electr. & Comput. En gineering, Univ. of Cincinnati, Cincinnati, OH, USA
Volume :
19
Issue :
7
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
1319
Lastpage :
1323
Abstract :
The increasing leakage power consumption and stringent thermal constraint necessitate more aggressive leakage control techniques. Power gating and body biasing are widely used for standby leakage control. Their large energy overhead for performing mode transition is the major obstacle for more aggressive leakage control. Temperature and process variation (TV/PV) further magnify the overhead problem, leading to so-called “corner case leakage control” problem. Light-weight Vth hopping (LW-VH) is a candidate technique to tackle the energy overhead problem. This paper demonstrates the application of LW-VH on microarchitectural- and RTL-level idleness exploitation with adaptive control techniques for TV/PV compensation. Adaptive LW-VH shows 30% average saving on total CPU leakage at microarchitectural level, and 4% to 15% leakage saving at RTL level. By combining all the techniques proposed in this paper, a three-tier aggressive leakage control system is introduced to fully exploit idleness at all levels.
Keywords :
electrical faults; leakage currents; power consumption; CPU leakage; adaptive light-weight hopping; aggressive leakage control system; aggressive runtime leakage control; energy overhead problem; leakage power consumption; microarchitectural level; mode transition; stringent thermal constraint; temperature-process variation; Adaptive control; Central Processing Unit; Control systems; Energy consumption; Lighting control; Microarchitecture; Programmable control; Runtime; TV; Temperature control; $V_{rm th}$ hopping; Adaptive leakage control; body biasing; corner case leakage control; power gating;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2047955
Filename :
5460998
Link To Document :
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