DocumentCode
1485990
Title
Aggressive Runtime Leakage Control Through Adaptive Light-Weight
Hopping With Temperature and Process Variation
Author
Xu, Hao ; Jone, Wen-Ben ; Vemuri, Ranga
Author_Institution
Dept. of Electr. & Comput. En gineering, Univ. of Cincinnati, Cincinnati, OH, USA
Volume
19
Issue
7
fYear
2011
fDate
7/1/2011 12:00:00 AM
Firstpage
1319
Lastpage
1323
Abstract
The increasing leakage power consumption and stringent thermal constraint necessitate more aggressive leakage control techniques. Power gating and body biasing are widely used for standby leakage control. Their large energy overhead for performing mode transition is the major obstacle for more aggressive leakage control. Temperature and process variation (TV/PV) further magnify the overhead problem, leading to so-called “corner case leakage control” problem. Light-weight Vth hopping (LW-VH) is a candidate technique to tackle the energy overhead problem. This paper demonstrates the application of LW-VH on microarchitectural- and RTL-level idleness exploitation with adaptive control techniques for TV/PV compensation. Adaptive LW-VH shows 30% average saving on total CPU leakage at microarchitectural level, and 4% to 15% leakage saving at RTL level. By combining all the techniques proposed in this paper, a three-tier aggressive leakage control system is introduced to fully exploit idleness at all levels.
Keywords
electrical faults; leakage currents; power consumption; CPU leakage; adaptive light-weight hopping; aggressive leakage control system; aggressive runtime leakage control; energy overhead problem; leakage power consumption; microarchitectural level; mode transition; stringent thermal constraint; temperature-process variation; Adaptive control; Central Processing Unit; Control systems; Energy consumption; Lighting control; Microarchitecture; Programmable control; Runtime; TV; Temperature control; $V_{rm th}$ hopping; Adaptive leakage control; body biasing; corner case leakage control; power gating;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2010.2047955
Filename
5460998
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