Title :
Canonical Scattering Feature Models for 3D and Bistatic SAR
Author :
Jackson, Julie Ann ; Rigling, Brian D. ; Moses, Randolph L.
Author_Institution :
Ohio State Univ., Columbus, OH, USA
fDate :
4/1/2010 12:00:00 AM
Abstract :
This paper develops three-dimensional (3D), bistatic parametric models that describe canonical radar scattering responses of several geometric objects. These models find use in inverse scattering-based processing of high-frequency radar returns. Canonical feature models are useful for extracting geometry from synthetic-aperture radar (SAR) scattering measurements and as feature primitives for automatic target recognition (ATR) and scene visualization. Previous work has considered monostatic feature models for two-dimensional (2D) radar processing; we extend this work to consider bistatic and 3D radar apertures. In the work presented here, we generalize geometric theory of diffraction (GTD) solutions for several scattering mechanisms in a plane. Products of these planar mechanisms in azimuth and elevation are used to produce 3D bistatic scattering models for six canonical shapes: a rectangular plate, dihedral, trihedral, cylinder, top-hat, and sphere. The derived models are characterized by a small number of parameters, and are shown to agree with results obtained from high-frequency, asymptotic scattering simulations.
Keywords :
electromagnetic wave scattering; geometrical theory of diffraction; radar signal processing; radar target recognition; synthetic aperture radar; 2D radar processing; 3D bistatic scattering models; 3D synthetic aperture radar; asymptotic scattering simulation; automatic target recognition; bistatic SAR; canonical radar scattering; geometric theory of diffraction; inverse scattering; monostatic feature models; scene visualization; Geometry; Layout; Parametric statistics; Physical theory of diffraction; Radar measurements; Radar scattering; Solid modeling; Synthetic aperture radar; Target recognition; Visualization;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
DOI :
10.1109/TAES.2010.5461639