A study on nano-wear at laser-textured bump tips and the failure mechanism at the head-bump-interface

Author

Xuan, Jack ; Shih, Chung ; Feng, Zhu ; Peng, Grant ; Nguyen, Thanh

Author_Institution

Seagate Technol., Milpitas, CA, USA

Volume

33

Issue

5

fYear

1997

fDate

9/1/1997 12:00:00 AM

Firstpage

3187

Lastpage

3189

Abstract

The disk laser-texture technique has been developed to provide a more controllable head-bump-interface (HBI) for low stiction and low glide. However, this new interface also introduced some new tribology issues, such as the possibility of more catastrophic failures at the HBT. This paper presents a study on nano-scaled sliding wear and fatigue wear on crater-type laser-bumps. To understand the failure mechanism, the cyclic loading-unloading, impacts, and stress during CSS cycles were analyzed for bumps having different rim-sizes (2-14 μm) and densities (spacing 10-100 μm). Stress wear tests using altitude chambers and CSS tests were conducted for bump-size 5-15 μm and bump-spacing 20-60 μm to further examine the HBI wear behavior. The experimental results agreed with the analytical study on the bump design safe regime for minimum wear failure

Keywords

failure analysis; hard discs; laser materials processing; magnetic heads; magnetic recording; sliding friction; surface texture; surface treatment; wear testing; 10 to 100 mum; 2 to 14 mum; bump design safe regime; contact start/stop cycles; crater-type laser-bumps; cyclic loading-unloading; disk laser-texture technique; failure mechanism; fatigue wear; head-bump interface; impacts; laser-textured bump tips; low glide; low stiction; nano-scaled sliding wear; nano-wear; rim-sizes; stress; stress wear tests; tribology issues; Cascading style sheets; Failure analysis; Fatigue; Geometrical optics; Heterojunction bipolar transistors; Magnetic heads; Optical control; Stress; Surface emitting lasers; Testing; Tribology;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.617886

Filename

617886