• DocumentCode
    1486384
  • Title

    Structure and optical properties of MnSbPt films with giant magnetic Kerr rotation

  • Author

    Saito, S. ; Watanabe, M. ; Shoji, Hajime ; Takahashi, M.

  • Author_Institution
    Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    3253
  • Lastpage
    3255
  • Abstract
    The mechanism of the MO effect for the Mn50Sb44 Pt6 film was discussed from the viewpoints of the structure and optical properties. As results, it was clarified; (1) the Mn50Sb44Pt6 film after annealing at 300°C was found to consist of MnSb with the ordered NiAs phase and PtMnSb with the disordered f.c.c. phase. (2) The resonancelike MO Kerr effect at about 2.1 eV was the unique character only for the Mn50 Sb44Pt6 film. (3) For the Mn50Sb 44Pt6 film after being annealed at 300°C the maximum of θK at around 2.1 eV, where εxx ´ was relatively small, originated from εxy´
  • Keywords
    Kerr magneto-optical effect; X-ray diffraction; annealing; antimony alloys; ferromagnetic materials; magnetic thin films; manganese alloys; metallic thin films; nuclear magnetic resonance; optical constants; platinum alloys; refractive index; sputtered coatings; 2.1 eV; 300 degC; MO effect; Mn50Sb44Pt6; Mn50Sb44Pt6 film; MnSb; MnSbPt; MnSbPt films; PtMnSb; RF sputtering; annealing; disordered FCC phase; giant magnetic Kerr rotation; magnetooptical effect; optical properties; ordered NiAs phase; resonancelike MO Kerr effect; structure; Annealing; Kerr effect; Magnetic field measurement; Magnetic films; Magnetic properties; Mechanical factors; Nonlinear optics; Optical films; Resonance; Tensile stress; Wavelength measurement; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.617908
  • Filename
    617908