DocumentCode :
1486800
Title :
Exchange coupled NiFe-TbCo thin films for use in self-biased magnetoresistive heads
Author :
Cain, William C. ; Lee, J.W. ; Koeppe, Peter V. ; Kryder, Mark H.
Author_Institution :
Carnegie-Mellon Univ., Pittsburgh, PA, USA
Volume :
24
Issue :
6
fYear :
1988
fDate :
11/1/1988 12:00:00 AM
Firstpage :
2609
Lastpage :
2611
Abstract :
It is found that the exchange field produced at the NiFe-TbCo interface has a maximum value at a TbCo layer composition of 27.5%. When proper sputtering conditions are used, this deposited composition produces an exchange field as large as 500 Oe when the layer is coupled to a 370-Å Permalloy layer. Torque and VSM data indicate that the TbCo layers have both in-plane and perpendicular anisotropy components and that the in-plane M-H loops of films that produce the maximum exchange field are square. A linear decrease in exchange field is observed as the NiFe layer thickness increases. The exchange field is independent of the TbCo layer thickness in the range of 1000-4000 Å. Films with a 500-Å layer of TbCo exhibited a greatly reduced exchange effect. A preliminary 500-Å-thick 128-μm×20-μm permalloy head biased with 2000 Å of TbCo exhibited at ΔR/R of 1.45%. The hard-axis coercivity is negligibly small (<0.5 Oe) in the range of 1 Hz to >1 MHz
Keywords :
Permalloy; cobalt alloys; magnetic heads; magnetic thin film devices; magnetoresistance; terbium alloys; 1 Hz to 1 MHz; 128 micron; 20 micron; 370 to 4000 A; NiFe layer thickness; NiFe-TbCo thin films; Permalloy layer; TbCo layer thickness; VSM data; exchange coupled thin films; exchange field; hard-axis coercivity; in-plane M-H loops; magnetic recording; permalloy head; perpendicular anisotropy components; self-biased magnetoresistive heads; sputtering conditions; torque data; Anisotropic magnetoresistance; Antiferromagnetic materials; Couplings; Ferrimagnetic films; Helium; Magnetic field measurement; Magnetic films; Magnetic heads; Sputtering; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.92188
Filename :
92188
Link To Document :
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