Auger spectroscopy analysis of metal/ferrite interface layer in metal-in-gap magnetic head

Author

Kajiwara, K. ; Hayakawa, M. ; Kunito, Y. ; Ikeda, Y. ; Hayashi, K. ; Aso, K. ; Ishida, T.

Author_Institution

Sony Corp. Res. Center, Yokohama, Japan

Volume

24

Issue

6

fYear

1988

fDate

11/1/1988 12:00:00 AM

Firstpage

2620

Lastpage

2622

Abstract

It is well known that a poor magnetic layer is formed at the interface between the metal film (e.g. Sendust) and the ferrite core in fabricating metal-in-gap heads. The authors have analyzed precisely the poor magnetic layer by means of Auger spectroscopy combined with ion sputtering. It is found that the poor magnetic layer is formed by reaction at the interface between the metal film and the substrate during the annealing process. In the case of Sendust, this layer is composed of Al₂O₃+SiO₂, which is a nonmagnetic material. For a new soft magnetic alloy, Fe-Ga-Si-Ru, used instead of sendust, the reacted layer is composed of SiO₂/Ga ₂O₃. To prevent the reaction, a very thin intermediate film of SiO₂ or Si-N-O was formed by sputtering

Keywords

Auger effect; ferrite applications; ferrites; interface phenomena; magnetic heads; sputtering; Al₂O₃; Al₂O₃-SiO₂; Auger spectroscopy analysis; Fe-Ga-Si-Ru; FeGaSiRu-SiNO; FeGaSiRu-SiO₂; FeSiAl; MIG type; SiO₂-Ga₂O₃; SiO₂/Ga₂O₃ reacted layer; annealing process; ion sputtering; magnetic head; metal-in-gap heads; metal/ferrite interface layer; poor magnetic layer; soft magnetic alloy; substrate; Annealing; Ferrite films; Magnetic analysis; Magnetic cores; Magnetic films; Magnetic heads; Soft magnetic materials; Spectroscopy; Sputtering; Substrates;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92192

Filename

92192