• DocumentCode
    1486988
  • Title

    Analysis of discontinuities in planar dielectric waveguides: an eigenmode propagation method

  • Author

    Liu, Qing-Huo ; Chew, Weng Cho

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    39
  • Issue
    3
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    422
  • Lastpage
    430
  • Abstract
    The eigenmode propagation method is proposed to analyze the discontinuity problems in planar dielectric waveguides. This recursive algorithm is based on the numerical mode matching method, but it uses less computation time and computer memory, which makes the analysis of multiregion, vertically stratified media much more effective. With this algorithm, the required computer memory is independent of the number of regions in the problem, and the computation time is linearly proportional to the number of regions. Therefore, it is particularly suitable for the analysis of planar waveguide discontinuities and waveguide bends. Using this method, larger problems can be analyzed which are impractical with the finite element method. Numerical examples are given to demonstrate that the computation time is linearly proportional to the number of discontinuities, while the computer memory is almost a constant independent of the number of discontinuities
  • Keywords
    S-parameters; dielectric waveguides; eigenvalues and eigenfunctions; waveguide theory; computation time; computer memory; discontinuities; eigenmode propagation method; numerical mode matching method; planar dielectric waveguides; recursive algorithm; vertically stratified media; waveguide bends; Algorithm design and analysis; Circuit analysis computing; Dielectrics; Finite element methods; Mode matching methods; Optical computing; Optical waveguides; Planar waveguides; Waveguide components; Waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.75283
  • Filename
    75283