• DocumentCode
    1487006
  • Title

    A method of moments analysis and a finite-difference time-domain analysis of a probe-sleeve fed rectangular waveguide cavity

  • Author

    Jarem, John M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alabama Univ., Huntsville, AL, USA
  • Volume
    39
  • Issue
    3
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    444
  • Lastpage
    451
  • Abstract
    A multifilament method of moments (MOM) analysis and a finite-difference time-domain (FE-TD) analysis are used to numerically calculate the input impedance of a probe-sleeve fed rectangular waveguide which has been short-circuited on one side. The input impedance of the system is determined by using the above methods for several probe-sleeve configurations, and reasonable agreement between the two methods for the cases studied is found. An MOM Green´s function formulation which is based on scattering superposition and which allows the input impedance of a probe-sleeve feed to be calculated when the waveguide is terminated in a given load is derived. The MOM results and FD-TD numerical results are compared for this loaded waveguide input impedance case, and reasonable agreement between the methods is found. A comparison of theory and experiment is given for when the waveguide is terminated in a ground plane aperture
  • Keywords
    difference equations; electric impedance; probes; rectangular waveguides; time-domain analysis; waveguide theory; Green´s function formulation; finite-difference time-domain analysis; input impedance; loaded waveguide; moments method analysis; multifilament method of moments; probe-sleeve fed; rectangular waveguide cavity; scattering superposition; Feeds; Finite difference methods; Green´s function methods; Impedance; Loaded waveguides; Message-oriented middleware; Moment methods; Rectangular waveguides; Scattering; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.75286
  • Filename
    75286